Semiconductors Lab   

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Facilities 

High vacuum thin Film deposition 

Hot wire CVD (Chemical Vapor Deposition)

Thermal evaporation Deposition

 Thin Films characterization

- Optoelectronic properties characterization -

                Transmission reflection measurements

                Dark & Photoconductivity measurements

                Constant Photocurrent Method (CPM)

                Modulated Photocurrent Method  (MPC)

                Steady State Photograding Technique (SSPG) (under preparation)

                Photothermal Deflection Spectroscopy (PDS) (under preparation)

                Modeling of the behavior of the optoelectronic properties

- Film structure characterization (in collaborating Labs)-

                AFM 

                FTIR

                X-rays

                Raman spectroscopy