Semiconductors Lab   

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Techniques             

                In-situ characterization of HW-CVD thin film deposition

                Transmission reflection measurements

                Dark & Photoconductivity measurements

                Constant Photocurrent Method (CPM)

                Modulated Photocurrent (MPC)

                Steady State Photograding Technique (SSPG) (under preparation)

                Photothermal Deflection Spectroscopy (PDS) (under preparation)

                Modeling of the behavior of the optoelectronic properties